Normal view MARC view ISBD view

Essentials of electronic testing for digital, memory and mixed signal VLSI circuits

Bushnell, Michael L

Essentials of electronic testing for digital, memory and mixed signal VLSI circuits - New York: Kluwer Academic Publishers, 2000 - 690

ISBN: 9780792379911

Subjects--Personal Names:
Digital integrated circuits--Testing

Dewey Class. No.: 621.395 / BUS-E

Print
Add to your cart (remove)
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)