CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing Book 40) (Record no. 117008)
[ view plain ]
| 000 -LEADER | |
|---|---|
| fixed length control field | 00327 a2200085 4500 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | B009KZX4D6 |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Manoj Sachdev, Andrei Pavlov |
| 245 ## - TITLE STATEMENT | |
| Title | CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing Book 40) |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Name of publisher, distributor, etc | Springer |
| Date of publication, distribution, etc | 2008 |
No items available.