MARC details
| 000 -LEADER |
|---|
| fixed length control field |
01491cam a22004094a 4500 |
| 001 - CONTROL NUMBER |
|---|
| control field |
6255229 |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
|---|
| control field |
20170731151055.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
070119s2007 ne a b 001 0 eng c |
| 016 7# - NATIONAL BIBLIOGRAPHIC AGENCY CONTROL NUMBER |
|---|
| Record control number |
981108016 |
| Source |
GyFmDB |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9788184894295 |
| 035 ## - SYSTEM CONTROL NUMBER |
|---|
| System control number |
(OCoLC)ocm79447484 |
| 035 ## - SYSTEM CONTROL NUMBER |
|---|
| System control number |
(OCoLC)79447484 |
| 035 ## - SYSTEM CONTROL NUMBER |
|---|
| System control number |
(NNC)6255229 |
| 040 ## - CATALOGING SOURCE |
|---|
| Original cataloging agency |
OHX |
| Transcribing agency |
OHX |
| Modifying agency |
BTCTA |
| -- |
BAKER |
| -- |
YDXCP |
| -- |
ZCU |
| 042 ## - AUTHENTICATION CODE |
|---|
| Authentication code |
pcc |
| 050 #4 - LIBRARY OF CONGRESS CALL NUMBER |
|---|
| Classification number |
TK7871.99.M44 |
| Item number |
S23 2007 |
| 072 #7 - SUBJECT CATEGORY CODE |
|---|
| Subject category code |
TK |
| Source |
lcco |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
621.395 |
| Item number |
SAC-D |
| 100 1# - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Sachdev, Manoj |
| 245 10 - TITLE STATEMENT |
|---|
| Title |
Defect-oriented testing for nano-metric CMOS VLSI circuits |
| Statement of responsibility, etc |
by Manoj Sachdev and José Pineda de Gyvez. |
| 250 ## - EDITION STATEMENT |
|---|
| Edition statement |
2nd ed. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
|---|
| Place of publication, distribution, etc |
Dordrecht : |
| Name of publisher, distributor, etc |
Springer, |
| Date of publication, distribution, etc |
c2007. |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
xxi, 328 p. : |
| Other physical details |
ill. ; |
| Dimensions |
24 cm. |
| 490 1# - SERIES STATEMENT |
|---|
| Series statement |
Frontiers in electronic testing ; |
| Volume number/sequential designation |
34 |
| 500 ## - GENERAL NOTE |
|---|
| General note |
New edition of: Defect oriented testing for CMOS analog and digital circuits, 1998. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
Metal oxide semiconductors, Complementary |
| General subdivision |
Testing. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
Metal oxide semiconductors, Complementary |
| General subdivision |
Defects. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
Integrated circuits |
| General subdivision |
Very large scale integration |
| -- |
Testing. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
Integrated circuits |
| General subdivision |
Very large scale integration |
| -- |
Defects. |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Title of a work |
Defect oriented testing for CMOS analog and digital circuits. |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Pineda de Gyvez, Jose |
| 830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE |
|---|
| Uniform title |
Frontiers in electronic testing ; |
| Volume number/sequential designation |
34. |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Source of classification or shelving scheme |
Dewey Decimal Classification |
| Item type |
Books |
| 948 0# - LOCAL PROCESSING INFORMATION (OCLC); SERIES PART DESIGNATOR (RLIN) |
|---|
| Series part designator, SPT (RLIN) |
20070806 |
| b (OCLC) |
x |
| c (OCLC) |
sl13 |
| d (OCLC) |
MPS |
| 948 1# - LOCAL PROCESSING INFORMATION (OCLC); SERIES PART DESIGNATOR (RLIN) |
|---|
| Series part designator, SPT (RLIN) |
20070807 |
| b (OCLC) |
p |
| c (OCLC) |
mw2064 |
| d (OCLC) |
OSMC |
