Thoughtful machine learning: a test-driven approach
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- 9789351108573
- 006.31 KIR-T
Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds |
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IIITD General Stacks | Computer Science and Engineering | 006.31 KIR-T (Browse shelf(Opens below)) | Available | 004777 | ||
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IIITD Reference | Computer Science and Engineering | REF 006.31 KIR-T (Browse shelf(Opens below)) | Checked out | 03/07/2024 | 004778 |
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REF 006.31 GOO-D Deep learning | REF 006.31 HAS-E Elements of statistical learning : data mining, inference, and prediction | REF 006.31 HOP-L Learning tensorflow : | REF 006.31 KIR-T Thoughtful machine learning: a test-driven approach | REF 006.31 MIT-M Machine learning | REF 006.31 MOH-F Foundations of machine learning | REF 006.31 MUR-M Machine learning : a probabilistic perspective |
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