Analog IC reliability in nanometer CMOS
Material type: TextPublication details: New York : Springer, ©2013.Description: xvi,198 p.; 22 cmISBN:- 9781461461623
- 621.381 MAR-A
Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Books | IIITD Reference | Electronics and Communication Engineering | REF 621.381 MAR-A (Browse shelf(Opens below)) | Loan on demand | 005182 |
Total holds: 0
Browsing IIITD shelves, Shelving location: Reference, Collection: Electronics and Communication Engineering Close shelf browser (Hides shelf browser)
REF 621.381 LAU-E Electrons in molecules : | REF 621.381 LUN-N Nanoscale transistors : | REF 621.381 MAL-E Electronic principles | REF 621.381 MAR-A Analog IC reliability in nanometer CMOS | REF 621.381 MIL-E Electronic devices and circuits | REF 621.381 MIL-I Integrated electronics | REF 621.381 OLI-E Electronic measurements and instrumentation. |
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