CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test
Material type: TextSeries: Frontiers in electronic testing ; 40Publication details: New Delhi : Springer, ©2008.Description: xvi, 193 p. : ill. ; 25 cmISBN:- 9788132202325
- 621.381 PAV-C
Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Books | IIITD General Stacks | Electronics and Communication Engineering | 621.3815 PAV-C (Browse shelf(Opens below)) | Not for loan | 009656 |
Total holds: 0
Includes bibliographical references and index.
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