Testing Software and Systems [electronic resource] : 24th IFIP WG 6.1 International Conference, ICTSS 2012, Aalborg, Denmark, November 19-21, 2012, Proceedings /

Requirements-Driven Log Analysis -- Active Learning of Extended Finite State Machines -- Testing in Practice -- Efficient and Trustworthy Tool Qualification for Model-Based Testing Tools -- Managing Execution Environment Variability during Software Testing:mAn Industrial Experience -- A Technique for Agile and Automatic Interaction Testing for Product Lines -- CaPTIF: Comprehensive Performance TestIng Framework -- Test Frameworks for Distributed Systems Towards a TTCN-3 Test System for Runtime Testing of Adaptable and Distributed Systems -- Passive Interoperability Testing for Request-Response Protocols: Method, Tool and Application on CoAP Protocol -- Using Knapsack Problem Model to Design a Resource Aware Test Architecture for Adaptable and Distributed Systems.-Testing of Embedded Systems Off-Line Test Case Generation for Timed Symbolic Model-Based Conformance Testing -- Querying Parametric Temporal Logic Properties on Embedded Systems -- State Estimation and Property-Guided Exploration for Hybrid Systems Testing -- Test Optimization -- Extending Coverage Criteria by Evaluating Their Robustness to Code Structure Changes -- Using Behaviour Inference to Optimise Regression Test Sets -- New Testing Methods -- Machine Learning Approach in Mutation Testing -- Lightweight Automatic Error Detection by Monitoring Collar Variables -- Protocol Testing and Performance Evaluation for MANETs with Non-uniform Node Density Distribution -- Parameterized GUI Tests.

This book constitutes the refereed proceedings of the 24th IFIP WG 6.1 International Conference on Testing Software and Systems, ICTSS 2012, held in Aalborg, Denmark, in November 2012. The 16 revised full papers presented together with 2 invited talks were carefully selected from 48 submissions. The papers are organized in topical sections on testing in practice, test frameworks for distributed systems, testing of embedded systems, test optimization, and new testing methods.