Fault-tolerance and reliability techniques for high-density random-access memories
Material type: TextPublication details: Delhi : Pearson Education, ©2002.Description: xix, 426 p.; 25 cmISBN:- 9788178087696
- 621.3973 CHA-F
Item type | Current library | Collection | Call number | Status | Notes | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|---|
Books | IIITD General Stacks | Electronics and Communication Engineering | 621.3973 CHA-F (Browse shelf(Opens below)) | Available | Gifted by Dr. G.S. Visweswaran | G01166 |
Total holds: 0
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621.397 UYE-C CMOS logic circuit design | 621.397 UYE-C CMOS logic circuit design | 621.397 UYE-C CMOS logic circuit design | 621.3973 CHA-F Fault-tolerance and reliability techniques for high-density random-access memories | 621.398 PER-N Next generation wireless LANs : | 621.398 PER-N Next generation wireless LANs : | 621.398 PLA-C CMOS integrated analog-to-digital and digital-to-analog converters |
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