Fault diagnosis of analog integrated circuits
Material type: TextSeries: Frontiers in electronic testing ; v. 30Publication details: New Delhi : Springer, c2005.Description: ix, 182pISBN:- 9788181288622
- 621.3815 22 KAB-F
- TK7874.654 .K335 2005
Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Books | IIITD General Stacks | Electronics and Communication Engineering | 621.3815 KAB-F (Browse shelf(Opens below)) | Available | 002391 |
Total holds: 0
Browsing IIITD shelves, Shelving location: General Stacks, Collection: Electronics and Communication Engineering Close shelf browser (Hides shelf browser)
621.3815 HEL-M Modern electronic instrumentation and measurement techniques | 621.3815 HOR-M Microelectronic circuits and devices | 621.3815 ITO-U Ultra-low voltage nano-scale memories | 621.3815 KAB-F Fault diagnosis of analog integrated circuits | 621.3815 KAN-S Semiconductor devices | 621.3815 KUM-F Fundamentals of digital circuits | 621.3815 MAH-A Analog electronics |
Includes bibliographical references and index.
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