CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test
Material type:![Text](/opac-tmpl/lib/famfamfam/BK.png)
- 9788132202325
- 621.381 22 PAV-C
- TK7871.99.M44 P38 2008
Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds |
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IIITD General Stacks | Electronics and Communication Engineering | 621.381 PAV-C (Browse shelf(Opens below)) | Available | 002415 |
Total holds: 0
Includes bibliographical references and index.
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