Next generation wireless LANs : throughput, robustness, and reliability in 802.11n
Material type: TextPublication details: New Delhi : Cambridge University Press, 2008.Description: xxx, 385 p. : ill. ; 26 cmISBN:- 9780521758338
- 621.398 22 PER-N
- TK5105.78 .P47 2008
Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Books | IIITD General Stacks | Electronics and Communication Engineering | 621.398 PER-N (Browse shelf(Opens below)) | Available | 002641 |
Total holds: 0
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621.397 UYE-C CMOS logic circuit design | 621.397 UYE-C CMOS logic circuit design | 621.3973 CHA-F Fault-tolerance and reliability techniques for high-density random-access memories | 621.398 PER-N Next generation wireless LANs : | 621.398 PER-N Next generation wireless LANs : | 621.398 PLA-C CMOS integrated analog-to-digital and digital-to-analog converters | 621.398 PLA-C CMOS integrated analog-to-digital and digital-to-analog converters |
Includes bibliographical references and index.
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