Digital integrated circuits : design-for-test using simulink and stateflow
Material type: TextPublication details: Boca Raton, FL : CRC Press, c2007.Description: 320 p. : ill. ; 25 cmISBN:- 9780849330575
- Design-for-test using Simulink and Stateflow
- 621.381 22 PER-D
- TK7874 .P445 2007
Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Books | IIITD General Stacks | Electronics and Communication Engineering | 621.381 PER-D (Browse shelf(Opens below)) | Available | 004274 | ||
Books | IIITD Reference | Electronics and Communication Engineering | REF 621.381 PER-D (Browse shelf(Opens below)) | Available | 004275 |
Total holds: 0
Browsing IIITD shelves, Shelving location: General Stacks, Collection: Electronics and Communication Engineering Close shelf browser (Hides shelf browser)
621.381 PAT-P Principles of electronic instrumentation | 621.381 PAU-E Electronic circuit : | 621.381 PAV-C CMOS SRAM circuit design and parametric test in nano-scaled technologies : | 621.381 PER-D Digital integrated circuits : | 621.381 PIE-S Semiconductor device fundamentals | 621.381 PIL-E Electrical and electronics engineering materials | 621.381 PIL-E Electrical and electronics engineering materials |
Includes bibliographical references and index.
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