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	1.	Essentials of electronic testing for digital, memory and mixed signal VLSI circuits by Bushnell, Michael L Agrawal, Vishwani D Material type: Text; Format: print ; Literary form: Not fiction Publication details: New York: Kluwer Academic Publishers, 2000 Availability: Items available for loan: IIITD (1)Call number: 621.395 BUS-E. Items available for reference: IIITD: Not for loan (1)Call number: REF 621.395 BUS-E. Place hold Add to cart (remove)
	2.	Digital integrated circuits : design-for-test using simulink and stateflow by Perelroyzen, Evgeni Material type: Text; Format: print ; Literary form: Not fiction Publication details: Boca Raton, FL : CRC Press, c2007 Other title: Design-for-test using Simulink and Stateflow Online access: Table of contents only Publisher description Availability: Items available for loan: IIITD (2)Call number: 621.381 PER-D, ... Place hold Add to cart (remove)

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