000 | 00833nam a22002417a 4500 | ||
---|---|---|---|
003 | IIITD | ||
005 | 20220206020003.0 | ||
008 | 190814b xxu||||| |||| 00| 0 eng d | ||
020 | _a9788132202325 | ||
040 | _aDLC | ||
082 | 0 | 4 |
_a621.381 _bPAV-C |
100 | 1 | _aPavlov, Andrei | |
245 | 1 | 0 |
_aCMOS SRAM circuit design and parametric test in nano-scaled technologies : _bprocess-aware SRAM design and test _cAndrei Pavlov, Manoj Sachdev. |
260 |
_aNew Delhi : _bSpringer, _c©2008. |
||
300 |
_axvi, 193 p. : _bill. ; _c25 cm. |
||
490 |
_aFrontiers in electronic testing ; _v40 |
||
504 | _aIncludes bibliographical references and index. | ||
650 | 0 |
_aMetal oxide semiconductors, Complementary _xDesign. |
|
650 | 0 | _aRandom access memory. | |
650 | 0 | _aNanoelectronics. | |
700 | 1 | _aSachdev, Manoj | |
942 |
_2ddc _cBK _03 |
||
999 |
_c14204 _d14204 |