| 000 | 01276nam a22003257a 4500 | ||
|---|---|---|---|
| 001 | 247260 | ||
| 003 | IIITD | ||
| 005 | 20230622170011.0 | ||
| 008 | 230622b xxu||||| |||| 00| 0 eng d | ||
| 010 | _a 99221465 | ||
| 020 | _a0201596245 | ||
| 035 | _a(DLC) 99221465 | ||
| 035 | _a(OCoLC)40927130 | ||
| 040 |
_aUk _cUk _dDLC _dIIITD |
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| 042 | _alccopycat | ||
| 050 | 0 | 0 |
_aQA76.76.T48 _bK66 1999 |
| 082 | 0 | 0 |
_a005.14 _221 _bKOO-T |
| 100 | 1 | _aKoomen, Tim | |
| 245 | 1 | 0 |
_aTest process improvement : _ba practical step-by-step guide to structured testing _cby Tim Koomen and Martin Pol |
| 260 |
_aLondon : _bAddison-Wesley, _c©1999 |
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| 300 |
_axv, 215 p. : _bill. ; _c24 cm. |
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| 504 | _aIncludes bibliographic references and index. | ||
| 505 |
_t1. Introduction _t2. The scope of testing _t3. Need for improvement _t4. A model for test process improvement _t5. The TPI model _t6. Application of the TPI model _t7. Levels by key area |
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| 650 | 0 |
_aComputer software _xTesting. |
|
| 650 | 0 |
_aElectronic data processing _xStructured techniques. |
|
| 700 | 1 | _aPol, Martin | |
| 906 |
_a7 _bcbc _ccopycat _d2 _encip _f19 _gy-gencatlg |
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| 942 |
_2ddc _cBK |
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| 999 |
_c171379 _d171379 |
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