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001 978-3-030-55704-1
003 DE-He213
005 20240423125048.0
007 cr nn 008mamaa
008 201102s2020 sz | s |||| 0|eng d
020 _a9783030557041
_9978-3-030-55704-1
024 7 _a10.1007/978-3-030-55704-1
_2doi
050 4 _aTK7867-7867.5
072 7 _aTJFC
_2bicssc
072 7 _aTEC008010
_2bisacsh
072 7 _aTJFC
_2thema
082 0 4 _a621.3815
_223
100 1 _aRocha da Rosa, Felipe.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
245 1 0 _aSoft Error Reliability Using Virtual Platforms
_h[electronic resource] :
_bEarly Evaluation of Multicore Systems /
_cby Felipe Rocha da Rosa, Luciano Ost, Ricardo Reis.
250 _a1st ed. 2020.
264 1 _aCham :
_bSpringer International Publishing :
_bImprint: Springer,
_c2020.
300 _aXI, 136 p. 53 illus., 51 illus. in color.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
505 0 _aChapter 1 . Introduction -- Chapter 2. Background on Soft Errors -- Chapter 3. Fault Injection Framework Using Virtual Platforms -- Chapter 4. Performance and Accuracy Assessment of Fault Injection Frameworks Based on VPs -- Chapter 5. Extensive Soft Error Evaluation -- Chapter 6. Machine Learning Applied to Soft Error Assessment in Multicoresystems.
520 _aThis book describes the benefits and drawbacks inherent in the use of virtual platforms (VPs) to perform fast and early soft error assessment of multicore systems. The authors show that VPs provide engineers with appropriate means to investigate new and more efficient fault injection and mitigation techniques. Coverage also includes the use of machine learning techniques (e.g., linear regression) to speed-up the soft error evaluation process by pinpointing parameters (e.g., architectural) with the most substantial impact on the software stack dependability. This book provides valuable information and insight through more than 3 million individual scenarios and 2 million simulation-hours. Further, this book explores machine learning techniques usage to navigate large fault injection datasets. Describes the most suitable and efficient virtual platforms to include fault injection capabilities, aiming to support the soft error analysis of state-of-the-artprocessor models; Includes analysis and port of several benchmarks from embedded and HPC domains, including the Rodinia and NASA NAS Parallel Benchmark (NPB) suites; Introduces four novel, non-intrusive FI techniques enabling software engineers to perform in-depth and relevant soft error evaluation, addressing the gap between the available FI tools and the industry requirements; Explores machine learning techniques that can be used to enable the identification of individual (or combinations of) microarchitectural and software parameters that present the most substantial relation relationship with each detected soft error or failure.
650 0 _aElectronic circuits.
650 0 _aElectronics.
650 0 _aMicroprocessors.
650 0 _aComputer architecture.
650 1 4 _aElectronic Circuits and Systems.
650 2 4 _aElectronics and Microelectronics, Instrumentation.
650 2 4 _aProcessor Architectures.
700 1 _aOst, Luciano.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
700 1 _aReis, Ricardo.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
710 2 _aSpringerLink (Online service)
773 0 _tSpringer Nature eBook
776 0 8 _iPrinted edition:
_z9783030557034
776 0 8 _iPrinted edition:
_z9783030557058
776 0 8 _iPrinted edition:
_z9783030557065
856 4 0 _uhttps://doi.org/10.1007/978-3-030-55704-1
912 _aZDB-2-SCS
912 _aZDB-2-SXCS
942 _cSPRINGER
999 _c173802
_d173802