000			00565nam a2200193Ia 4500
003			IIITD
005			20230616020002.0
008			130106s9999 xx 000 0 und d
020			_a9780792379911
040			_aa
082			_a621.395 _bBUS-E
100			_aBushnell, Michael L
245			_aEssentials of electronic testing for digital, memory and mixed signal VLSI circuits
260			_bKluwer Academic Publishers, _c2000 _aNew York:
300			_a690
600			_aDigital integrated circuits--Testing
700			_aAgrawal, Vishwani D
942			_2ddc _cBK _01
999			_c7251 _d7251