| 000 | 01008cam a22002897a 4500 | ||
|---|---|---|---|
| 001 | 16370748 | ||
| 005 | 20140924165914.0 | ||
| 008 | 100802s2011 nyua b 001 0 eng d | ||
| 010 | _a 2010933852 | ||
| 020 | _a9781441969927 | ||
| 035 | _a(OCoLC)ocn699778302 | ||
| 040 |
_aNjP _cPUL _dNDD _dVRC _dBTCTA _dYDXCP _dDLC |
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| 042 | _alccopycat | ||
| 050 | 0 | 0 |
_aTK7870 _b.S5294 2011 |
| 082 |
_a621.395 _bNIC-S |
||
| 100 | _aNicolaidis, Michael. | ||
| 245 | 0 | 0 |
_aSoft errors in modern electronic systems _cMichael Nicolaidis, editor. |
| 260 |
_aNew York : _bSpringer, _cc2011. |
||
| 300 |
_axviii, 316 p. : _bill. (some col.) ; _c25 cm. |
||
| 490 | 1 |
_aFrontiers in electronic testing, _x0929-1296 ; _v41 |
|
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 | _aElectronic systems. | |
| 830 | 0 |
_aFrontiers in electronic testing ; _v41. |
|
| 906 |
_a7 _bcbc _ccopycat _d2 _encip _f20 _gy-gencatlg |
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| 942 |
_2ddc _cBK |
||
| 999 |
_c7449 _d7449 |
||