| 000 | 01336cam a22004097a 4500 | ||
|---|---|---|---|
| 001 | 7899241 | ||
| 003 | IIITD | ||
| 005 | 20140501153850.0 | ||
| 006 | m d | ||
| 007 | cr n | ||
| 008 | 060501s2005 ne a sb 001 0 eng d | ||
| 016 |
_aB0513216 _2bccb |
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| 020 | _a9788181288622 | ||
| 024 | 3 | _a9780387257426 (hd.bd.) | |
| 035 | _a(WaSeSS)ssj0000153773 | ||
| 040 |
_aOHX _cOHX _dBAKER _dHNK _dNLGGC _dDLC _dWaSeSS |
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| 042 | _alccopycat | ||
| 050 | 4 |
_aTK7874.654 _b.K335 2005 |
|
| 072 | 7 |
_aTK _2lcco |
|
| 082 | 0 | 0 |
_a621.3815 _222 _bKAB-F |
| 100 | 1 | _aKabisatpathy, Prithviraj. | |
| 210 | 1 | 0 | _aFault diagnosis of analog integrated circuits |
| 245 | 1 | 0 |
_aFault diagnosis of analog integrated circuits _cby Prithviraj Kabisatpathy, Alok Barua and Satyabroto Sinha. |
| 260 |
_aNew Delhi : _bSpringer, _cc2005. |
||
| 300 | _aix, 182p. | ||
| 490 | 1 |
_aFRET _v30 |
|
| 504 | _aIncludes bibliographical references and index. | ||
| 506 | _aLicense restrictions may limit access. | ||
| 650 | 0 | _aLinear integrated circuits. | |
| 650 | 0 |
_aLinear integrated circuits _xTesting. |
|
| 700 | 1 | _aBarua, Alok. | |
| 700 | 1 | _aSinha, Satyabroto. | |
| 773 | 0 | _tSpringerLink ebooks - Engineering (2005) | |
| 830 | 0 |
_aFrontiers in electronic testing _vv. 30 |
|
| 910 | _aLibrary of Congress record | ||
| 942 |
_2ddc _cBK |
||
| 999 |
_c8253 _d8253 |
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