000 01277cam a22003497a 4500
001 13627023
003 IIITD
005 20140925150318.0
008 040617s2005 gw a b 001 0 eng
010 _a 2004109048
015 _aGBA458062
_2bnb
016 7 _a012967852
_2Uk
020 _a9788181284822
035 _a(CStRLIN)CUBGGLAD185397152-B
035 _a(CU)GLAD185397152
040 _a*UKM*
_c*UKM*
_dHkUST
_d*C#P*
_dCU
_dCStRLIN
_dDLC
042 _alccopycat
050 0 0 _aT174.7
_b.N37327 2005
082 0 0 _a620.5
_222
_bFAH-N
100 _aFahrner, W. R.
245 0 0 _aNanotechnology and nanoelectronics :
_bmaterials, devices, measurement techniques
_cW.R. Fahrner (editor).
260 _aBerlin ;
_aNew York :
_bSpringer,
_cc2005.
300 _axvi, 269 p. :
_bill. ;
_c24 cm.
504 _aIncludes bibliographical references (p. [239]-260) and index.
650 0 _aNanotechnology.
856 4 1 _3Table of contents
_uhttp://www.loc.gov/catdir/toc/fy054/2004109048.html
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/enhancements/fy0816/2004109048-d.html
906 _a7
_bcbc
_ccopycat
_d2
_eepcn
_f20
_gy-gencatlg
942 _2ddc
_cBK
999 _c8375
_d8375