Advanced test methods for SRAMs :
Bosio, Alberto
Advanced test methods for SRAMs : effective solutions for dynamic fault detection in nanoscaled technologies by Alberto Bosio - New York : Springer, ©2010 - xv, 171 p. : ills. ; 23cm.
Bibliography and index
9781489983145
Engineering
Random access memory-testing
Systems engineering
Computer-aided design
621.397 / BOS-A
Advanced test methods for SRAMs : effective solutions for dynamic fault detection in nanoscaled technologies by Alberto Bosio - New York : Springer, ©2010 - xv, 171 p. : ills. ; 23cm.
Bibliography and index
9781489983145
Engineering
Random access memory-testing
Systems engineering
Computer-aided design
621.397 / BOS-A