Advanced test methods for SRAMs : effective solutions for dynamic fault detection in nanoscaled technologies
Material type: TextPublication details: Springer, ©2010 New York :Description: xv, 171 p. : ills. ; 23cmISBN:- 9781489983145
- 621.397 BOS-A
Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Books | IIITD Reference | Electronics and Communication Engineering | REF 621.397 BOS-A (Browse shelf(Opens below)) | Not for loan | 009733 |
Total holds: 0
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