VLSI test principles and architectures :
VLSI test principles and architectures : design for testability
edited by Laung-Terng Wang, Cheng-Wen Wu and Xiaoqing Wen.
- New Delhi : Elsevier, ©2006.
- xxx, 777 p. : ill. ; 25 cm.
- The Morgan Kaufmann series in systems on silicon .
Includes bibliographical references and index.
9789380501550
2006006869
Integrated circuits--Very large scale integration--Testing.
Integrated circuits--Very large scale integration--Design.
TK7874.75 / .V587 2006
621.395 / WAN-V
Includes bibliographical references and index.
9789380501550
2006006869
Integrated circuits--Very large scale integration--Testing.
Integrated circuits--Very large scale integration--Design.
TK7874.75 / .V587 2006
621.395 / WAN-V