MARC details
000 -LEADER |
fixed length control field |
01439cam a22003494a 4500 |
001 - CONTROL NUMBER |
control field |
14278872 |
003 - CONTROL NUMBER IDENTIFIER |
control field |
IIITD |
005 - DATE AND TIME OF LATEST TRANSACTION |
control field |
20210206152116.0 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
fixed length control field |
060227s2006 ne a b 001 0 eng |
010 ## - LIBRARY OF CONGRESS CONTROL NUMBER |
LC control number |
2006006869 |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
9789380501550 |
035 ## - SYSTEM CONTROL NUMBER |
System control number |
(OCoLC)ocm64624834 |
040 ## - CATALOGING SOURCE |
Original cataloging agency |
DLC |
Transcribing agency |
DLC |
Modifying agency |
BAKER |
-- |
C#P |
-- |
IXA |
-- |
DLC |
042 ## - AUTHENTICATION CODE |
Authentication code |
pcc |
050 00 - LIBRARY OF CONGRESS CALL NUMBER |
Classification number |
TK7874.75 |
Item number |
.V587 2006 |
082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
621.395 |
Edition number |
22 |
Item number |
WAN-V |
245 00 - TITLE STATEMENT |
Title |
VLSI test principles and architectures : |
Remainder of title |
design for testability |
Statement of responsibility, etc |
edited by Laung-Terng Wang, Cheng-Wen Wu and Xiaoqing Wen. |
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
Place of publication, distribution, etc |
New Delhi : |
Name of publisher, distributor, etc |
Elsevier, |
Date of publication, distribution, etc |
©2006. |
300 ## - PHYSICAL DESCRIPTION |
Extent |
xxx, 777 p. : |
Other physical details |
ill. ; |
Dimensions |
25 cm. |
440 #4 - SERIES STATEMENT/ADDED ENTRY--TITLE |
Title |
The Morgan Kaufmann series in systems on silicon |
504 ## - BIBLIOGRAPHY, ETC. NOTE |
Bibliography, etc |
Includes bibliographical references and index. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Integrated circuits |
General subdivision |
Very large scale integration |
-- |
Testing. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Integrated circuits |
General subdivision |
Very large scale integration |
-- |
Design. |
700 1# - ADDED ENTRY--PERSONAL NAME |
Personal name |
Wang, Laung-Terng |
Relator term |
editor |
700 1# - ADDED ENTRY--PERSONAL NAME |
Personal name |
Wu, Cheng-Wen |
Relator term |
editor |
700 1# - ADDED ENTRY--PERSONAL NAME |
Personal name |
Wen, Xiaoqing |
Relator term |
editor |
856 41 - ELECTRONIC LOCATION AND ACCESS |
Materials specified |
Table of contents |
Uniform Resource Identifier |
<a href="http://www.loc.gov/catdir/toc/ecip069/2006006869.html">http://www.loc.gov/catdir/toc/ecip069/2006006869.html</a> |
856 42 - ELECTRONIC LOCATION AND ACCESS |
Materials specified |
Publisher description |
Uniform Resource Identifier |
<a href="http://www.loc.gov/catdir/enhancements/fy0632/2006006869-d.html">http://www.loc.gov/catdir/enhancements/fy0632/2006006869-d.html</a> |
906 ## - LOCAL DATA ELEMENT F, LDF (RLIN) |
a |
7 |
b |
cbc |
c |
orignew |
d |
1 |
e |
ecip |
f |
20 |
g |
y-gencatlg |
942 ## - ADDED ENTRY ELEMENTS (KOHA) |
Source of classification or shelving scheme |
Dewey Decimal Classification |
Koha item type |
Books |
Koha issues (borrowed), all copies |
3 |