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Introduction to VLSI design flow

By: Material type: TextTextPublication details: New York : Cambridge University Press, ©2023Description: xxiv, 689 p. 24 cmISBN:
  • 9781009200813
Subject(s): DDC classification:
  • 621.395 SAU-I
Contents:
Part I. Overview of VLSI Design Flow: Chapter 1. Foundation Chapter 2. Introduction to Integrated Circuits Chapter 3. Pre-RTL Methodologies Chapter 4. RTL to GDS Implementation Flow Chapter 5. Verification Techniques Chapter 6. Testing Techniques Chapter 7. Post-GDS Processes Part II. Logic Design: Chapter 8. Modeling Hardware using Verilog Chapter 9. Simulation-based Verification Chapter 10. RTL Synthesis Chapter 11. Formal Verification, Chapter 12. Logic Optimization Chapter 13. Technology Library Chapter 14. Static Timing Analysis Chapter 15. Constraints Chapter 16. Technology Mapping Chapter 17. Timing-driven Optimizations Chapter 18. Power Analysis Chapter 19. Power-driven Optimizations Part III. Design for Testability (DFT): Chapter 20. Basics of DFT Chapter 21. Scan Design Chapter 22. Automatic Test Pattern Generation (ATPG) Chapter 23. Built-in Self-test (BIST) Part IV. Physical Design: Chapter 24. Basic Concepts for Physical Design Chapter 25. Chip Planning Chapter 26. Placement Chapter 27. Clock Tree Synthesis (CTS) Chapter 28. Routing Chapter 29. Physical Verification and Signoff Chapter 30. Post-silicon Validation.
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Holdings
Item type Current library Collection Call number Status Date due Barcode Item holds Course reserves
Books Books IIITD General Stacks Electronics and Communication Engineering 621.395 SAU-I (Browse shelf(Opens below)) Checked out 09/10/2024 013081
Books Books IIITD General Stacks Electronics and Communication Engineering 621.395 SAU-I (Browse shelf(Opens below)) Pending hold 013087
Books Books IIITD General Stacks Electronics and Communication Engineering 621.395 SAU-I (Browse shelf(Opens below)) Available 013082
Books Books IIITD General Stacks Electronics and Communication Engineering 621.395 SAU-I (Browse shelf(Opens below)) Available 013083
Books Books IIITD General Stacks Electronics and Communication Engineering 621.395 SAU-I (Browse shelf(Opens below)) Available 013086
Books Books IIITD General Stacks Electronics and Communication Engineering 621.395 SAU-I (Browse shelf(Opens below)) Available 013079
Books Books IIITD General Stacks Electronics and Communication Engineering 621.395 SAU-I (Browse shelf(Opens below)) Checked out 09/10/2024 013078
Books Books IIITD General Stacks Electronics and Communication Engineering 621.395 SAU-I (Browse shelf(Opens below)) Checked out 09/10/2024 013080
Books Books IIITD General Stacks Electronics and Communication Engineering 621.395 SAU-I (Browse shelf(Opens below)) Available 013084
Books Books IIITD General Stacks Electronics and Communication Engineering 621.395 SAU-I (Browse shelf(Opens below)) Checked out 14/10/2024 013085
Books Books IIITD General Stacks Electronics and Communication Engineering 621.395 SAU-I (Browse shelf(Opens below)) Checked out 07/10/2024 012807
Books Books IIITD General Stacks Electronics and Communication Engineering 621.395 SAU-I (Browse shelf(Opens below)) Checked out 09/10/2024 012806
Books Books IIITD Reference Electronics and Communication Engineering REF 621.395 SAU-I (Browse shelf(Opens below)) Not for loan 012021

VLSI Design Flow UG/PG (REST) MNS24

Advanced Digital Design and Verification (New) UG/PG MNS24

Books Books IIITD General Stacks Electronics and Communication Engineering 621.395 SAU-I (Browse shelf(Opens below)) Checked out 15/10/2024 012020
Total holds: 1

This book includes an index.

Part I. Overview of VLSI Design Flow: Chapter 1. Foundation Chapter 2. Introduction to Integrated Circuits Chapter 3. Pre-RTL Methodologies Chapter 4. RTL to GDS Implementation Flow Chapter 5. Verification Techniques Chapter 6. Testing Techniques Chapter 7. Post-GDS Processes Part II. Logic Design: Chapter 8. Modeling Hardware using Verilog Chapter 9. Simulation-based Verification Chapter 10. RTL Synthesis Chapter 11. Formal Verification, Chapter 12. Logic Optimization Chapter 13. Technology Library Chapter 14. Static Timing Analysis Chapter 15. Constraints Chapter 16. Technology Mapping Chapter 17. Timing-driven Optimizations Chapter 18. Power Analysis Chapter 19. Power-driven Optimizations Part III. Design for Testability (DFT): Chapter 20. Basics of DFT Chapter 21. Scan Design Chapter 22. Automatic Test Pattern Generation (ATPG) Chapter 23. Built-in Self-test (BIST) Part IV. Physical Design: Chapter 24. Basic Concepts for Physical Design Chapter 25. Chip Planning Chapter 26. Placement Chapter 27. Clock Tree Synthesis (CTS) Chapter 28. Routing Chapter 29. Physical Verification and Signoff Chapter 30. Post-silicon Validation.

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