VLSI test principles and architectures : design for testability
Material type:![Text](/opac-tmpl/lib/famfamfam/BK.png)
- 9789380501550
- 621.395 22 WAN-V
- TK7874.75 .V587 2006
Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds |
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IIITD Reference | Electronics and Communication Engineering | REF 621.395 WAN-V (Browse shelf(Opens below)) | Available | 008153 | ||
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IIITD General Stacks | Electronics and Communication Engineering | 621.395 WAN-V (Browse shelf(Opens below)) | Available | 002299 |
Total holds: 0
Includes bibliographical references and index.
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